[ SS-35.1500 ]

XY Scanning Slit Beam Profiler, 1.5 kW

Dual axis beam profiler using orthogonal slits that move through the beam using a single actuator. Dual integral Faraday cups.

[ Beam Profilers ]

SS-35.1500

XY Scanning Slit Beam Profiler, 1.5 kW

The XY Scanning Slits Beam Profiler measures charged particle beam intensity and maps beam profiles along two transverse axes. The system uses a moving probe plate with two perpendicular slots to scan across the beam. A small portion of the beam passes through the slots into integrated Faraday cups, where the captured charge is measured.

Key features include:

  • Two-axis transverse beam profile measurement
  • Slotted probe plate with integrated Faraday cups
  • Shielded signal cables for low-noise current transmission
  • Two-channel transimpedance amplifier for current-to-voltage conversion
  • Analog-to-digital data acquisition with control software
  • Graphical user interface for scan setup, control, and profile plotting
  • Adjustable spatial resolution and scan speed
  • Water-cooled, refractory-metal-coated plate for higher power density beams than typical wire scanners

Specifications

Maximum Beam Power 1.5 kW
Maximum Power Density 50 W/mm2
Maximum Beam Size Ø35 mm
Slit Width 0.5 mm
Minimum Actuator Step Size 0.05 mm
Maximum Scan Speed 40 mm/s
Probe Travel 165 mm

Materials

Head Molybdenum (Face)
Faraday Cup Copper

Cooling

Cooling Water Flow 2 L/min
Water Pressure Drop 60 psi (at 2 L/min)

Controller

Form Factor 19 Inch Rack Mount, 2U
Input Voltage 100-230 VAC
Communication Ethernet, 10/100/1000 Mbps
Current to Voltage Sensitivity 1000 μA/V, 100 μA/V, 10 μA/V, 1 μA/V (software controlled)
Amplifier Gain Ranges 0.5x-1000x (software controlled)
Internal Analog to Digital Converter +/- 10 V Input, 12 bit Resolution
Analog to Digital Bandwidth 1 kHz
Programmable Low Pass Filter 10 Hz - 1 kHz
Fred Grillet
Fred Grillet
M.Eng, P.Eng
Director of Engineering

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